In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

The deep learning algorithm developed by researchers at the University of Illinois Urbana-Champaign is trained to remove the effects of the probe’s width from AFM microscope images. As reported in the ...

Atomic force microscopy (AFM) is a cornerstone technique for nanoscale manipulation, and has applications in nanoparticle assembly, biomolecule handling, semiconductor device manufacturing, etc.

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

AzoMaterials speaks to Cassandra Phillips and Qichi Hu from Bruker about how their new Resonance-Enhanced Force Volume AFM-IR technology overcomes the limitations of conventional nanoscale ...

Polymers are crucial across multiple sectors, including food packaging, tire fabrication, adhesives, and medical‑grade plastics. Photothermal atomic force microscope‑based infrared spectroscopy ...

Researchers have developed a deep learning algorithm for removing systematic effects from atomic force microscopy images, enabling more precise profiles of material surfaces. Atomic force microscopy, ...

(Nanowerk News) Take a photo with your phone and you might see wonderful details—leaves on a tree, strands of hair blowing in the wind. The width of that strand of hair is 100,000 nanometers wide. The ...

(a) A scanning electron microscope (SEM) image of the nanoneedle probe used for the measurements. (b) Elasticity map of a 1 µm × 1 µm area on the nuclear surface, showing the change in elasticity ...