Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Have you ever designed a product that you thought was ready to ship only to have it fail testing by not meeting safety requirements? Months can be lost and mistakes repeated if a company doesn’t have ...

Understand why testing must evolve beyond deterministic checks to assess fairness, accountability, resilience and ...

AI is transforming the software landscape, with many organizations integrating AI-driven workflows directly into their ...

Connected devices and systems have become an integral part of our everyday life and we take this for granted. Finding the fastest way to our destination with a smartphone, reading the news on a tablet ...

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...

CableEye wire harness testing systems easily link to custom test fixtures and harnesses and instantaneously check for faults, identify the type of faults, and pinpoint fault locations.