Steady state electromagnetic compliance and susceptibility testing, such as Transverse Electromagnetic (TEM) Cell, Direct Power Injection (DPI), and Bulk Current Injection (BCI), pose a significant ...
Fig 1. A typical CMOS input circuit comprises a “P” and “N” transistor. One is fully “on” for logic high, and the other is “on” for a logic low. Fig 2. When a CMOS input pin is at logic high or low ...
A design of voltage doubler circuit has been studied in context of electromagnetic energy harvesting using 28 nm FD-SOI technology. After analysis of the operating constraints of the circuit, the ...
The circuit has been constructed to provide an in-circuit system that will test the integrity of electronic components such as Silicon Controlled Rectifiers, diodes, and PNP or NPN transistors. 4093 – ...