A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” ...

The electronics industry is in the midst of a transformation that is drastically changing product design and manufacture. Deep submicron process technology puts more gates on a chip, and the ...

Safety mechanisms designed to handle rare events can become unreliable under sustained or intense fault conditions.

Test point selection and fault diagnosis remain critical challenges in the analysis and maintenance of analog systems. As these systems operate with continuous-valued signals and are susceptible to ...

When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...

Despite its standardization as IEEE 1149.1 in 1990 and wide use in the industry, many test engineers and developers still do not fully understand the benefits of boundary scan test. The misconceptions ...

The new Fisher Pierce® TPM Series Test Point Mounted Fault Indicator from Thomas & Betts helps workers locate faulted circuits in underground distribution systems quickly. The new Fisher Pierce® TPM ...

The oscillating wave test system from HDW Electric can be used to identify, evaluate, and locate partial discharge (PD) faults in a cable insulation and in joints and terminations. The system can be ...