Production test of a finished electronic product often involves two techniques: in-circuit test (ICT) and functional component test (FCT). The ICT technique examines a non-powered circuit board to ...
Over the last decade, there has been a move away from powered-up digital in-circuit vector testing to unpowered analog-based (vectorless) device-pin opens testing for large and sometimes small digital ...
As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...
The latest update to the Corelis ScanExpress JET (JTAG Embedded Test) library has pushed processor support to over 1000, with the addition of such key processor families as the Freescale Power ...
Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...
Where functional safety risks need to be controlled, relying solely on EMC testing is inadequate, no matter how high the test levels are cranked up. Further, many engineers and project managers are ...
Many books cover functional testing techniques, but relatively few also cover technical testing. “The Software Test Engineer’s Handbook, 2nd Edition” (US$49.95, 560 pages) from O’Reilly fills that gap ...
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