Think of them as master Lego builders, only at an atomic scale. Engineers at CU Boulder have taken a major step forward in combing advanced computer simulations with artificial intelligence to try to ...

In order to understand and control chip defects that cause failures, Semiconductor Research Corp. (SRC) and Columbia University reported today that its researchers have come up with new ways of ...

The reliability of electronic assemblies is directly related to the failure rate: higher reliability means a lower failure rate of the drive system, as it reduces the probability of failure within a ...

Designed for mission-critical communication and security systems, the CPC1130N, CPC1135N and CPC1231N are optically-coupled, normally-closed solid-state relays (SSRs) that employ depletion mode ...

The level of difficulty in designing electro-technique devices has increased, owing to thermal stress. With the development of electric vehicles and electric aircraft, and to keep up with the recent ...