With scaling technology and increasing design sizes, power consumption during test and test data volume have grown dramatically — making it almost impossible to test an entire design once it ...
It is often said that the emergence of the System-on-Chip will require fundamental changes in the approaches to design for testability (DFT.) These changes, it has been suggested, will take the form ...
A technical paper titled “Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation” was published by researchers at University of Florida. “Scan-based ...
As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...
Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
The proliferation of semiconductor devices into safety-critical applications such as automotive and medical opens a new can of worms for test and reliability. An ever widening range of devices must ...
WILSONVILLE, USA: Mentor Graphics Corp. announced that STMicroelectronics has adopted the TestKompress automatic test pattern generation (ATPG) product into its standard 65nm and 45nm design kits. The ...
It is often said that the emergence of the System-on-Chip will require fundamental changes in the approaches to design for testability (DFT.) These changes, it has been suggested, will take the form ...
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