Process capability indices (PCIs) have long served as crucial metrics in assessing the performance and quality of manufacturing processes. Recent advances in statistical estimation techniques have not ...

The Statistical Process Control Calculator (SPCC) aids in the prediction and analysis of process yield. The calculator can be used with an HP® 50g calculator or a free PC emulator. Steve Edwards, an ...

This course addresses the basic theory behind Statistical Process Control (SPC), a method used in monitoring and controlling the quality of a process through statistical analysis to reduce variation.

There is a boom in the volume of semiconductor devices being manufactured, and the boom is primarily credited to the proliferation of Internet of Things (IoT)-based devices in our daily lives. IoT ...

This asynchronous course addresses the basic theory behind Statistical Process Control (SPC), a method used in monitoring and controlling the quality of a process through statistical analysis to ...

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...

A medical device manufacturer ditched a clunky ERP module for quality inspection, opting instead for specialized statistical process control software. Upgrading to new software costs time and money ...