Photo-induced force microscopy (PiFM) offers nanoscale defect characterization in semiconductors, combining chemical ...

You have full access to this article via your institution. Thus we conclude that spin filter-based approaches are subject to substantial losses of identifications at low sample loads, probably owing ...

The advent of next-generation sequencing has made possible genome analysis at previously unattainable depth. Roche, Illumina and Life Technologies, among others, have developedwell-established ...