The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.

The size of designs continues to grow and IC manufacturers are pushing for higher test quality, especially in mission-critical applications such as transportation and medicine. More advanced nodes ...

Design-for-test (DFT) engineers often struggle to develop a memory built-in self-test (BIST) grouping plan, deciding which memories belong to which BIST group, to improve test time, routing effort, ...

Taken literally, embedded test is just that: test capabilities that exist wholly embedded within a system. Power-on self-test is an example as is a built-in performance-monitoring feature programmed ...

BackTrack 5, code named “Revolution”, the much awaited penetration testing framework, was released in May 2011. It is a major development over BackTrack4 R2. BackTrack 5 is said to be built from ...